XPL-40 Polarized Microscope for Mineral Phase Analysis

NegotiableUpdate on 06/23

Model

Nature of the Manufacturer: Producers

Product Category

Place of Origin

Online Consult

Overview

XPL-40 Polarized Microscope for Mineral Phase Analysis

Product Details

application

XPL-40Equipped with stress free flat field objective lens, the imaging quality is superior;This instrument is an essential tool for studying and identifying substances with birefringence using the polarization characteristics of light. It can be used by a wide range of users for single polarization observation, orthogonal polarization observation, cone light observation, and microscopic photography; Simultaneously equipped with gypsumλPian, micaλ/4Accessories such as chips, quartz wedges, and movable rulers are a new type of product with relatively complete functionsInIt is widely used in many industries, such as chemical fiber, semiconductor industry, and drug inspection.

Product specifications

Specification parameters				XPL-40
Optical path system	Limited distance 160mm mechanical cylinder length			●
viewing head	Hinged binocular head, 30 ° tilt, adjustable visibility			●
	Triple head, 30 ° tilt, adjustable visual acuity, 100% daylight photography
eyepiece	WF10X (Φ 18mm)/WF10X dividing eyepiece			●
Stress free flat field achromatic objective lens(Uncovered glass slide)	Magnification	Numerical aperture (N.A.)	Working distance (W.D.)	●
	4×	0.1	19.8
	10×	0.25	8.8
	40×(S)	0.6	3.73
	60×(S)	0.75	1.34
magnification	40×-600×			●
Objective Wheel	Four hole objective lens converter			●
stage	360 degree rotating stage (diameter: Φ 150mm), adjustable center, equipped with locking device, with a grid value of 6			●
Focuser	Coarse and micro coaxial focusing mechanism with locking and limiting devices			●
	Micro grid value 0.002mm, focusing range 30mm
Polarizing device	360 degree rotating polarizer with four readings of 0, 90, 180, and 270, push-pull analyzer			●
compensator	Gypsum λ sheet, mica λ/4 sheet, quartz wedge			●
Intermediate connecting tube	Built in analyzer, can freely switch between normal observation and polarized observation, can rotate 360 ° polarization direction, with scale, cursor value of 12, push in Burgundy mirror, center adjustable			●
Lighting System	Spotlight NA.1.25, equipped with variable aperture light bar and adjustable field of view light bar, with color filter bracket			●
	Collector (suitable for halogen lighting), 6V/20W halogen lamp, adjustable brightness
Upgradeable accessories	Eyepiece: WF16X (Φ 11mm)			○
	Objective lens: 20 ×/50 ×/80 ×/100 × (dry)			○
	Mobile ruler: moving range 30mmX25mm			○
	High temperature heating table			○
	PUDA High Pixel Digital Imaging System			○
	Particle analysis statistical software			○
Note: ● is standard, ○ is an upgradable accessory

Instrument completeness

Instrument completeness
⑴ One instrument host	⑷ Two eyepieces	⑺ One rotating stage	(10) Three compensators	1 spare fuse
⑵ Eyepiece tube 1 set	⑸ One dividing eyepiece	1 set of workpiece pressure spring plate	⑾ One national standard power cord	One dust cover for the instrument
⑶ Four objective lenses	(6) One micrometer	(9) Two color filters	12. One spare light bulb	1 set of random file archives

Digital application solution configuration

XPL-40C Computer Camera System		XPL-40D Digital Camera Camera
⑴	XPL-40 Three eye Polarized Microscope	⑴	XPL-40 Three eye Polarized Microscope
⑵	High quality CCD adapter lens	⑵	Professional digital camera delay mirror
⑶	PUDA 3 million USB imported chip microscope camera (using American APTINA high-performance chipset/USB2.0 high-speed communication, high-resolution, perfect color reproduction processing/Ultra Fine patented color rendering technology)	⑶	10 million pixel digital camera (recommended Nikon/Sony)
⑷	ToupView is a professional imaging software