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E-mail
yanzhijiance01@yeah. net
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Phone
134-7259-2873
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Address
No. 3, Lane 1998, Jinbi Road, Fengxian District, Shanghai
Shanghai Yanzhi Testing Equipment Co., Ltd
Strict quality diode thermal performance testing system
NegotiableUpdate on 11/28
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Overview
Product application meets: IEC61215-MQT18; IEC61730-MST07、MST25； IEC62979； Bypass diodes in solar modules are widely used to prevent operational quality degradation caused by module quality issues such as hot spots, occlusion, and unevenness. During the application of diodes, performance such as forward conduction and reverse cutoff may occur. In order to verify the performance advantages and disadvantages of diodes, this scheme has developed corresponding testing equipment according to IEC standards.
Product Details
1) Modular design enables automatic and manual testing, supporting multi-channel diode and temperature acquisition;
2)Real time monitoring of testing duration, junction box surface temperature (1 channel), diode current (extracted from constant current power supply), diode voltage drop and other data;
3)A curve that can display all data; The temperature curves of 30 ℃, 50 ℃, 70 ℃, and 90 ℃ are displayed in the same coordinate system, corresponding to the current curves during the triggering time period of the 300uS pulse power supply at temperatures of 30 ℃, 50 ℃, 70 ℃, and 90 ℃ displayed in the same coordinate system;
4)According to the test data, the VD to TJ characteristics are obtained by fitting the curve with least squares. The software displays the curve, which can display the corresponding voltage values for each temperature acquisition. The diode junction temperature is automatically calculated and the fitting equation is displayed on the interface;
5)For the temperature curve displayed during the working period of the programmable power supply, the corresponding current and voltage are displayed in the same coordinate system;
6)All data can be exported in EXCEL format, with curves or charts available for easy data processing and analysis.
| model | CHT-12D |
Pulse power supply | |
test scope |
0-20V |
| test accuracy | 2% |
| resolution | 0.001V |
| test scope | 0-40A |
| test accuracy | 1% |
| resolution | 0.01A |
programmable power supply | |
test scope |
0-20V |
| test accuracy | 2% |
| resolution | 0.1V |
| test scope | 0-40A |
| test accuracy | 1% |
| resolution | 0.01A |
temperature sensor | |
test scope |
0～200℃ |
| test accuracy | ±1℃ |
| resolution | 0.1℃ |
| repetitiveness | ±0.5℃ |
Temperature acquisition | |
Supports J, K, T, E, R, S, and B thermocouple inputs | |
| 16 bit resolution | |
| 8-way differential input | |
| T/C software configuration, low voltage current input | |
| Isolation voltage | 3000 Vdc |
| Support Modbus/RTU control accuracy | ±5% |
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