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Hangzhou Daji Optoelectronic Instrument Co., Ltd
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Hangzhou Daji Optoelectronic Instrument Co., Ltd

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    hzdjgd@189.cn

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    No. 200 Zhenhua Road, Xihu Science and Technology Park, Hangzhou City

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Grain Quality Image Analysis System

NegotiableUpdate on 05/19
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Overview

The GE-XP grain quality image analysis system is an automatic image analysis system used to detect impurities and imperfect grains in grains. Suitable for testing various types of grains. This system integrates computer technology and image processing technology, using CCD cameras, feeding mechanisms, driving mechanisms, discharging mechanisms, and an automatic image acquisition system

Product Details

The GE-XP grain quality image analysis system is an automatic image analysis system used to detect impurities and imperfect grains in grains. Suitable for testing various types of grains. This system integrates computer technology and image processing technology. Through CCD cameras, feeding mechanisms, driving mechanisms, and discharging mechanisms, as well as an automatic image acquisition system, it achieves automatic recognition of standard wheat, damaged wheat, and different types of grain mold through image processing and BP neural network classification algorithms.

Main performance indicators:
1. Rice grains: unripe grains, insect eaten grains, diseased grains, sprouting grains, moldy grains. Recognition accuracy ≥ 95%
2. Wheat: damaged grains, insect eaten grains, diseased grains, sprouting grains, moldy grains. Recognition accuracy ≥ 95%
3. Corn: damaged grains, insect eaten grains, diseased grains, sprouting grains, moldy grains, heat damaged grains. Recognition accuracy ≥ 95%
4. Rice: chalky grain rate, grain type, yellow grain rice, chalkiness degree. Recognition accuracy ≥ 95%