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Nanjing Fourth Analytical Instrument Co., Ltd
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XJL-02A Vertical Metallographic Microscope

NegotiableUpdate on 10/27
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Overview

XJL-02A Vertical Metallographic Microscope Main Technical Parameters: Instrument Key Features Description: XJL-02A Vertical Metallographic Microscope Main Features: The optical system of XJL-02A Vertical Metallographic Microscope adopts a negative focal length (f=33mm), and the photographic eyepiece and binocular observation system both adopt a flat field design field of view, which has the advantages of flatness and clarity

Product Details

XJL-02A Vertical Metallographic Microscope

Main technical parameters:

Description of key characteristics of the instrument:

XJL-02A Vertical Metallographic Microscope

Key Features:

The optical system of the XJL-02A vertical metallographic microscope adopts a negative focal length (f=33mm), and the photographic eyepiece and binocular observation system both adopt a flat field design field of view, which has the advantages of flatness and clarity. This product has functions such as bright field, dark field, polarization, projection, and grain comparison, and can be used for general research institutions, factories, and schools to conduct metallurgical and metallographic experiments.